Tuesday, 10 August
EMC Diagnostics of Complex Systems
- Vladimir Mordachev, Belorusskij gosudarstvennyi universitet informatiki i radioelektroniki, Minsk, , Belarus
The session is devoted to computer-aided and physical EMC diagnostics of complex systems. The development and practical application of technologies, models, and algorithms for analyzing the EMC of a complex system considered "as a whole" (taking into account both external electromagnetic environment and unwanted intrasystem electromagnetic couplings of various types) are discussed. The use of these technologies, models, and algorithms provides the ability of fast detection of propagation paths of internal and external electromagnetic disturbances that cause interference for the system. The problem of determining the relationship between the solutions of problems of EMC, electromagnetic protection, electromagnetic safety, and electromagnetic ecology of complex radio & electronic systems and complex wireless networks is covered.
Wednesday, 11 August
Advanced Methods to Model, Evaluate, and Measure Electromagnetic interference at Low Frequency in Transportation and Renewable Energy Systems
- Abduselam Hamid Beshir, Politecnico di Milano, Milan, Italy
- Waseem Wafik Elsayed,, Universiteit Twente Faculteit Elektrotechniek Wiskunde en Informatica, Zielona Gora, Lubuakie, Poland
The special session will provide an overview on low-frequency (i.e., starting from 2 kHz) Electromagnetic Compatibility issues in transportation and renewable energy systems, where the wide diffusion of power electronics converters is giving rise to increasing levels of conducted emissions with consequent problems in terms of coexistence between power and data lines. The session will include presentations about: (a) Power Quality and EMC Issues in the low-frequency range; (b) Modelling and simulation of power converters exploited in transportation and smart grid systems; and (c) topics for future standardization. The session is organized in the framework of the Marie Sklodowska-Curie (Horizon 2020) projects SCENT (Smart Cities EMC Network for Training) and ETOPIA (European Training network Of PhD researchers on Innovative EMI Analysis and Power Applications (ETOPIA), and will include ten papers.
Thursday, 12 August
- Fernando Ribeiro Arduini, Fraunhofer, Euskirchen, , Germany
This Special Session is focused on risk-based EMC. Recently, the EMC Guide for the EMC Directive has stated the need of risk-based EMC. The electromagnetic (EM) environment presents diversity and complexity. Risk analysis should be followed from the manufacturers regarding their equipment and therefore further research towards the subject would be beneficial. Risk-based EMC is also the core of the European PETER project (https://etn-peter.eu/). This Special Session allows PhD candidates from the PETER project as well as from other contributors to present their work in the field. The Special Session is strongly connected with academic and industrial partners and is expected to attract a large audience from the EMC community. The Session, as mentioned before, concentrates on a subject that has become a strong discussion in the EMC community in the last years. It involves the introduced risk-based EMC approach and it allows the new researchers to project their work.
Friday, 13 August
Robust Design for System Level ESD: Device, PCB and System Level
- David Pommerenke, Technische Universitat Graz, Graz, Austria
Abstract: The reduction of the features size within integrated circuits forces a reduction of IC level robustness which needs to be counteracted by system level design with respect to soft- and hard failures. This requires a combined approach of IC design and characterization for soft and hard failures, PCB and coupling analysis, and modeling of the transient behavior of protection structures that can reduce both soft and hard failures. The special session will reflect the progress in this area by talks on Combined TVS and IC modeling following the System Efficient ESD Design strategy both for high speed broadband and RF I/O Improvements of protection devices and its modeling Soft failure characterization of IC and systems including its modeling for both analog and digital ICs and SoC Possible improvements to the IEC 61000-4-2 test standard or its practical implementations to obtain more repeatable and meaningful results